Lab: Nano & Pico Characterization Lab
Equipment: Bruker Dimension 5000 Scanning Probe Microscope (SPM)
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| Bruker Dimension 5000 Scanning Probe Microscope (SPM) Nano & Pico Characterization Lab |
| Quantity: 1 Usage Type: Essential |
| Training Required: Yes Training Level: 1 Training Service Type: aid/trainer required Approval Required: Yes Service Type: aid/trainer available |
| Description: Veeco Dimension 5000 Scanning Probe Microscope (SPM) is an ideal automated tool for large-sample metrology and high-resolution imaging. This SPM is capable of measuring up to one hundred areas on samples up to 350mm in diameter. A comprehensive range of AFM and STM techniques enables the Dimension 5000 to detect faults and measure roughness and other features in three dimensions without any sample destruction, pretreatment, or modification. The addition of several applications modules further expands the Dimension 5000's functionality to include conductive and tunneling AFM as well as scanning capacitance and spreading resistance imaging. |