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CNSI Core Lab Management System
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Electron Imaging Center for NanoMachines (EICN)

New Users: Please click here to request an account in order to reserve equipment.
Existing Users: Please click here to login.

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Z. Hong Zhou, Faculty Director and Professor of MIMG
Sergey Ryazantsev, Associate Director and Ivo Atanasov, Associate Director

EICN New User Guide

About EICN:

Seeing molecules, materials, and molecular machines at atomic resolution and in three dimensions is critical to nanoscience. In order to facilitate this, the Electron Imaging Center for Nanomachines (EICN) was established at the California NanoSystems Institute (CNSI) through a major instrumentation grant from NIH and support from UCLA. EICN provides advanced electron imaging tools for a broad range of research, covering a scale range from tens of micrometers to angstroms, and delivering valuable structural information for cell biology, microbiology, biomolecular, molecular, and materials sciences. The state-of-the-art EICN facility offers all major electron microscopy (EM) modalities, including:

  • single particle cryo-electron microscopy (cryoEM)
  • cryo-electron tomography (cryoET)
  • cryo-immuno EM
  • single-particle 3D reconstruction
  • 3D tomographic reconstruction
  • ultrathin sectioning (room temperature and cryo)
  • high resolution shadowing with tungsten
  • high-resolution transmission electron microscopy (HR TEM)
  • scanning transmission electron microscopy (STEM)
  • energy dispersive X-ray spectroscopy (EDX) analysis for mass and elementary mapping
EICN is operated on a self-serve basis. Highly experienced staff provide the necessary training and can help users address their complex electron imaging needs.

For more information about EICN, please visit the EICN Website.
For instrument details and operating instructions, please click on the instrument icons on the left.
For further training and other inquires, please contact EICN associate directors Sergey Ryazantsev (sryazant AT ucla DOT edu) or Ivo Atanasov (ivo AT ucla DOT edu).