ZEISS Supra 40VP SEM, Room B146BElectron Imaging Center for Nanosystems (EICN)
Quantity: 1
Usage Type: Essential
Training Required: Yes
Training Level: 1
Training Service Type: aid/trainer required
Approval Required: Yes
Service Type: self-service
Description: The Zeiss SUPRA 40VP Field Emission Scanning Electron Microscope is a high performance SEM suitable for both materials and biological applications. It has a wide range of operating beam energies and is capable of variable pressure operation and elemental mapping with high spatial resolution.
Key features:
Easy-to-use control software
Adjustable beam energy from 100 eV to 30 eV
Short working distance; as low as 8.5 mm
High probe current (up to 20 nA) and high stability; better than 0.2 % / hour
Several detectors:
Secondary electron (SE) detector for typical SEM imaging
In-Lens SE detector for topographic imaging
Backscattered electron detector (BSE) for Z-contrast imaging
Variable pressure secondary electron detector (VPSE) for imaging in a partially pressurized environment; 1-133 Pa
Transmitted electron detector (Note: The transmission detector is currently out of service)
Energy dispersive X-ray (EDS) detector for elemental mapping (sensitive to elements heavier than boron)
Instructions to become a user can be found here: EICN Become a User. Training can be requested by emailing eicnhelp@cnsi.ucla.edu. If you do not receive a reply within 48 hours, you can email Matthew Mecklenburg (mmecklenburg@cnsi.ucla.edu) to follow up.
Reservation Details - Today's Date/Time: Oct 31 2024, 04:05 pm
April 08, 2024
