CNSI Core Lab Management System
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Lab: Nano & Pico Characterization Lab
Equipment: Bruker Dimension Icon Scanning Probe Microscope (SPM)

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November 28, 2020
 Saturday
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Equipment Color
Bruker Dimension Icon Scanning Probe Microscope (SPM)     Nano & Pico Characterization Lab
Quantity: 1     Usage Type: Essential    
Training Required: Yes     Training Level: 1     Training Service Type: aid/trainer available     Approval Required: Yes     Service Type: aid/trainer available
Description: Bruker Dimension Icon Scanning Probe Microscope (SPM) is a next-generation measurement system that brings new levels of performance, functionality, and accessibility to nanoscale researchers. The Icon system incorporates temperature-compensating position sensors that enable extraordinary performance in a large-sample, closed-loop, 90-micron scan range system. In addition to superior resolution, the Icon provides higher scan speeds without loss of image quality, a high-resolution camera and X-Y positioning for more efficient sample navigation, and the latest version of NanoScope software with intuitive workflow and default experiment modes.
Reservation Details  -  Today's Date/Time: Nov 28 2020, 10:55 am
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