ZEISS Supra 40VP SEM, Room B146BElectron Imaging Center for NanoMachines (EICN)
Quantity: 1
Usage Type: Essential
Training Required: Yes
Training Level: 1
Training Service Type: aid/trainer required
Approval Required: Yes
Service Type: self-service
Description: SUPRAU 40VP Field Emission Scanning Electron Microscope is a high performance Variable Pressure FE-SEM with the GEMINI column technology equipped with Thermo Noran System SIX EDS system.
Key features:
Superb resolution and image quality at low operating voltages
Wide operating voltage range with minimal adjustments required
Short working distance of 8.5 mm for simultaneous high resolution imaging and X-ray analysis
High probe current (up to 20 nA) and high stability better than 0.2 %/h for analytical applications
High efficiency In-lens detector for clear topographic imaging in high vacuum mode
Enhanced VPSE detector in VP mode
Easy operation through Windows based SmartSEMTM control software
Instructions to become a user can be found here: EICN Become a User. Training can be requested by emailing eicnhelp@cnsi.ucla.edu. If you do not receive a reply within 48 hours, you can email Matthew Mecklenburg (mmecklenburg@cnsi.ucla.edu) to follow up.
Reservation Details - Today's Date/Time: Jun 01 2023, 09:15 pm