Teneo SEM, Room B200BElectron Imaging Center for Nanosystems (EICN)
Quantity: 1
Usage Type: Essential
Training Required: Yes
Training Level: 1
Training Service Type: self-service
Approval Required: Yes
Service Type: self-service
Description: The FEI Teneo scanning electron microscope is an instrument suitable for imaging surface morphologies for both materials and biological samples. It is capable of beam deceleration, low vacuum operation, and elemental mapping.
Key features:
200 eV - 30 keV operating voltage
Beam deceleration (BD) for down to 20 eV landing energy
1.0 nm (30 kV) and 1.4 nm (1 kV with BD) resolution
Built-in plasma cleaner
Montage imaging for large fields of view
Several detectors:
Secondary electron (SE) detector for typical SEM imaging
In-Lens SE detectors for topographic imaging
Multi-segment backscatter electron detectors (BSE) for Z-contrast imaging
Low vacuum detector (LVD) for imaging in a partially pressurized environment, 10 - 50 Pa
Energy dispersive X-ray (EDS) detector for elemental mapping (Oxford Ultim Max 100 mm2)
Instructions to become a user can be found here: EICN Become a User. Training can be requested by emailing eicnhelp@cnsi.ucla.edu. If you do not receive a reply within 48 hours, you can email Matthew Mecklenburg (mmecklenburg@cnsi.ucla.edu) to follow up.
Reservation Details - Today's Date/Time: Dec 12 2024, 02:42 pm
November 01, 2024
