Lab: Nano & Pico Characterization Lab
Equipment: Bruker Dimension Icon SPM - Room B139
|Bruker Dimension Icon SPM - Room B139 Nano & Pico Characterization Lab
|Quantity: 1 Usage Type: Essential
|Training Required: Yes Training Level: 1 Training Service Type: aid/trainer available Approval Required: Yes Service Type: aid/trainer available
|Description: Bruker Dimension Icon Scanning Probe Microscope (SPM) is a next-generation measurement system that brings new levels of performance, functionality, and accessibility to nanoscale researchers. The Icon system incorporates temperature-compensating position sensors that enable extraordinary performance in a large-sample, closed-loop, 90-micron scan range system. In addition to superior resolution, the Icon provides higher scan speeds without loss of image quality, a high-resolution camera and X-Y positioning for more efficient sample navigation, and the latest version of NanoScope software with intuitive workflow and default experiment modes.