Training Required: Yes
Training Level: 1
Training Service Type: aid/trainer available
Approval Required: Yes
Service Type: aid/trainer available
Description:Bruker Dimension Icon Scanning Probe Microscope (SPM) is a next-generation measurement system that brings new levels of performance, functionality, and
accessibility to nanoscale researchers. The Icon system incorporates temperature-compensating position sensors that enable extraordinary performance in a large-sample,
closed-loop, 90-micron scan range system. In addition to superior resolution, the Icon provides higher scan speeds without loss of image quality, a high-resolution camera
and X-Y positioning for more efficient sample navigation, and the latest version of NanoScope software with intuitive workflow and default experiment modes.
Reservation Details - Today's Date/Time: Oct 08 2024, 05:43 pm