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Lab: Electron Imaging Center for Nanosystems (EICN)
Equipment: EM TRIM (Leica), Room B146

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equipment image
EM TRIM (Leica), Room B146     Electron Imaging Center for Nanosystems (EICN)
Quantity: 1     Usage Type: Supportive    
Training Required: Yes     Training Level: 1     Training Service Type: self-service     Approval Required: Yes     Service Type: self-service
Description: The Leica EM TRIM offers rapid sample trimming for TEM, SEM, and Light Microscopy. With a tungsten carbide or diamond milling tool, block faces of biological specimens can be trimmed for ultramicrotomy (mesa milling), SEM samples can be faced off and pills can be safely milled flat for IR techniques. Dust is extracted by vacuum from the working area and the user is protected from the miller by a cover. No more razor blades required for trimming!

Key features:

  • 0-90o tilt
  • 4 x 90o rotation (with stops)
  • Tungsten carbide milling tool
Reservation Details  -  Today's Date/Time: Jun 09 2026, 08:40 pm
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  • New Users:   Click here to ask for authorization.
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